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Texture mapping unit
Known as:
Texture-mapping unit
, TMU
, Texture mapping units
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A texture mapping unit (TMU) is a component in modern graphics processing units (GPUs), historically it was a separate physical processor. A TMU is…
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Related topics
Related topics
44 relations
AMD Radeon Rx 200 series
ARM Cortex-A15
ATI video card suffixes
ATi Radeon R300 Series
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Broader (1)
Graphics hardware
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
Impact of shrinking measurement error budgets on qualification metrology sampling and cost
M. Sendelbach
,
Niv Sarig
,
+7 authors
C. Archie
Advanced Lithography
2014
Corpus ID: 122621440
When designing an experiment to assess the accuracy of a tool as compared to a reference tool, semiconductor metrologists are…
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2012
2012
Improving the Performance of Execution Time Control by Using a Hardware Time Management Unit
K. N. Gregertsen
,
A. Skavhaug
International Conference on Reliable Software…
2012
Corpus ID: 42827081
This paper describes how a dedicated Time Management Unit (TMU) is used to reduce the overhead of execution time control. While…
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2011
2011
YieldStar: a new metrology platform for advanced lithography control
Josefine Maas
,
M. Ebert
,
+8 authors
V. Vaenkatesan
European Mask and Lithography Conference
2011
Corpus ID: 111110984
As leading edge lithography is moving to 2x-nm design rules, lithography control complements resolution as one of the main…
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2010
2010
Aggregate Statistics of National Traffic Management Initiatives
J. Rios
2010
Corpus ID: 167327449
Balancing traffic demand and capacity in the National Airspace System is accomplished through the use of various Traffic…
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Highly Cited
2007
Highly Cited
2007
Movement-Aware Vertical Handoff of WLAN and Mobile WiMAX for Seamless Ubiquitous Access
Wonjun Lee
,
Eunkyo Kim
,
Joongheon Kim
,
Inkyu Lee
,
Choonhwa Lee
IEEE transactions on consumer electronics
2007
Corpus ID: 20396986
This paper addresses a movement-aware vertical (MAV) handover algorithm between WLAN and Mobile WiMAX for seamless ubiquitous…
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2006
2006
A comprehensive test of optical scatterometry readiness for 65-nm technology production
V. Ukraintsev
SPIE Advanced Lithography
2006
Corpus ID: 108886600
Measurement bias is a central concept of critical dimension (CD) metrology. Bias is a complex function of sample, tool and time…
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2004
2004
Reducing measurement uncertainty drives the use of multiple technologies for supporting metrology
Bill Banke
,
C. Archie
,
+6 authors
E. Solecky
SPIE Advanced Lithography
2004
Corpus ID: 110702909
Perhaps never before in semiconductor microlithography has there been such an interest in the accuracy of measurement. This…
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2003
2003
A low power 3D rendering engine with two texture units and 29Mb embedded DRAM for 3G multimedia terminals
Ramchan Woo
,
Sungdae Choi
,
Ju-Ho Sohn
,
Seong-Jun Song
,
H. Yoo
European Solid-State Circuits Conference
2003
Corpus ID: 24052640
A low-power 3D rendering engine with 2 texture units and 29Mb embedded DRAM is designed and integrated into an LSI for portable…
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1998
1998
On-line quantitative determination of2H/1H isotope ratios in organic and water samples using an elemental analyser coupled to an isotope ratio mass spectrometer
S. Kelly
,
I. Parker
,
M. Sharman
,
M. Dennis
1998
Corpus ID: 42273270
A rapid continuous-flow technique for the quantitative determination of hydrogen isotope ratios in organic materials and water…
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Highly Cited
1994
Highly Cited
1994
Solvation structures of manganese(II), iron(II), cobalt(II), nickel(II), copper(II), zinc(II), cadmium(II), and indium(III) ions in 1,1,3,3-tetramethylurea as studied by EXAFS and electronic…
Y. Inada
,
Ken-ichi Sugimoto
,
K. Ozutsumi
,
S. Funahashi
1994
Corpus ID: 96083875
The structures of solvated complexes of Mn(II), Fe(II), Co(II), Ni(II), Cu(II), Zn(II), Cd(II), and In(III) ions in 1,1,3,3…
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