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High-temperature operating life

Known as: HTOL, High temperature operating life 
High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test… 
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Related topics

Related topics

15 relations
Boundary scanBuilt-in self-testCharge pumpDuty cycle

Broader (1)

Reliability engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
RRAM technology and its embedded potential on IoT applications
A highly reliable, substrate independent, and cost-effective (2 extra-masks) HfO 2 -based Resistive-Random-Access-Memory (RRAM… 
Review
2017
Review
2017
Performance enhancement of a modular test system for power semiconductors for HTOL testing by use of an embedded system
Today, performing life tests on power semiconductor devices is of major importance in industrial and automotive power… 
Review
2016
Review
2016
BTI induced dispersion: Challenges and opportunities for SRAM bit cell optimization
One of major CMOS reliability concern for advanced nodes is the Bias Temperature Instability mechanism. In addition to the native… 
2015
2015
Product-level reliability estimator with budget-based reliability management in 20nm technology
Product-level Reliability Estimator (PLRE) has been built for 20nm technology product. With PLRE, users can estimate failure rate… 
2015
2015
Reliability Prediction for Aerospace Electronics
Abstract : This project presents a method for predicting the failure rate, and thus the reliability of an electronic system by… 
2014
2014
Advances in reliability and operation space of high-voltage GaN power devices on Si substrates
GaN-on-Si power devices have advantages in both performance and the potential for low cost and high volume production. Advances… 
2007
2007
Qualification and Reliability of a GaN Process Platform
In this paper, the qualification of a production GaN process platform is discussed. Details of the process repeatability… 
2006
2006
Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration
2001
2001
Exceeding 60-Year Life Expectancy from an Electronic Energy Meter
2000
2000
New Methods for Building-In and Improvement of Integrated Circuit Reliability : Application to High Volume Semiconductor Manufacturing
Over the past 30 years the reliability of semiconductor products has improved by a factor of 100 while at the same time the… 
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