Deep-level transient spectroscopy

Known as: DLTS, Deep Level Transient Spectroscopy

Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in…

Papers overview

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2006

Theoretical aspects of a new technique for the MeV ion microbeam are described in detail for the first time. The basis of the…

2005

The deep-level transient spectroscopy (DLTS) system is fabricated using low-frequency capacitance measurements and is applied to…

2001

Deep level transient spectroscopy (DLTS) was used to obtain the energy level and the capture characteristics of InAs self…

2000

The interaction of atomic hydrogen with substitutional palladium impurities is studied in nand p-type Si by deep-level transient…

2000

The heterostructure conduction band offset, ΔEc, in InAs/GaAs self-organized quantum dots has been measured by deep level…

1995

A novel infrared photothermal radiometric deep‐level transient spectroscopy (PTR‐DLTS) has been developed for semiconductor…

1991

A defect specific analysis technique is introduced that combines the high concentration sensitivity of deep level transient…

1986

A totally automated, microcomputer-based deep-level transient spectroscopy (DLTS) system developed at the University of Arkansas…

1981

A microcomputer-based DLTS system is presented, in which the microcomputer functions as a signal averager and controller. The…

1980

The origins and characteristic parameters of levels occurring deep in the band gap of semiconductors have been summarised. The…