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Burst noise

Known as: Popcorn noise, Burst, Random telegraph noise 
Burst noise is a type of electronic noise that occurs in semiconductors. It is also called popcorn noise, impulse noise, bi-stable noise, or random… 
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Related topics

Related topics

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Asymmetric digital subscriber lineAtomic electron transitionIon implantationList of noise topics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2013
2013
The study of time constant analysis in random telegraph noise at the subthreshold voltage region
We extracted time constants capture and emission of Random Telegraph Noise (RTN), and their dependencies of the gate-source… 
Highly Cited
2011
Highly Cited
2011
Atomistic approach to variability of bias-temperature instability in circuit simulations
A blueprint for an atomistic approach to introducing time-dependent variability into a circuit simulator in a realistic manner is… 
2011
2011
95%-lower-BER 43%-lower-power intelligent solid-state drive (SSD) with asymmetric coding and stripe pattern elimination algorithm
This paper presents intelligent solid-state drives (SSDs), which decrease memory errors by 95% and reduce power consumption by 43… 
Highly Cited
2010
Highly Cited
2010
Direct observation of RTN-induced SRAM failure by accelerated testing and its application to product reliability assessment
A new accelerated testing scheme for detecting SRAM bit failure caused by random telegraph noise (RTN) is proposed. By repeatedly… 
Highly Cited
2009
Highly Cited
2009
Characterization of oxide traps leading to RTN in high-k and metal gate MOSFETs
We proposed a new method for characterization of oxide traps leading to Random Telegraph Noise (RTN) in high-k and metal gate… 
Highly Cited
2008
Highly Cited
2008
The observation of trapping and detrapping effects in high-k gate dielectric MOSFETs by a new gate current Random Telegraph Noise (IG-RTN) approach
A new method, called gate current random telegraph noise (IG RTN), was developed to analyze the oxide quality and reliability of… 
2007
2007
Giant Random Telegraph Signals in Nanoscale Floating-Gate Devices
The magnitude of a random telegraph signal (RTS) in nanoscale floating-gate devices has been experimentally investigated as a… 
Highly Cited
2006
Highly Cited
2006
The Impact of Random Telegraph Signals on the Scaling of Multilevel Flash Memories
This paper describes for the first time the observation of the threshold voltage (Vth) fluctuation due to random telegraph signal… 
Highly Cited
1998
Highly Cited
1998
Noise properties of ferromagnetic tunnel junctions
We report measurements of voltage fluctuations in magnetic tunnel junctions which exhibit both high and low magnetoresistance (MR… 
1997
1997
The gate bias and geometry dependence of random telegraph signal amplitudes [MOSFET]
A new random telegraph signal (RTS) amplitude model based upon band bending fluctuations has been developed, in contrast to other… 
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